Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs The FIB Sample Prep and grid Holder holds an FIB sample mounted on a standard 25mm (1″) pin stub for FIB milling and lift out procedures. It also holds FIB grids of the same thickness to mount the prepared lamellae on an FIB grid for subsequent TEM imaging. Versatile and cost effective holder suitable for all FIB/SEM systems which accept pin mount holders such as the FEI, Zeiss and Tescan systems. For the JEOL and Hitachi systems a pin mount adapter is needed. Brass thumbscrews facilitate easy loading and un-loading. Overall size is 50 x 29 x 13.5mm (2″ x 1-1/8″ x 5/8″). Standard ø3.2mm (1/8″) pin. Material: vacuum grade aluminum with brass screws. Screws used are Screw used is 4-40 x 3/8, Thumb, Brass and 6-32 x 1/2, Thumb, Brass
