Description
DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker’s new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.The DDRFESP40 probe provides: High performance contact resonance imaging with Dimension Icon
High electrical performance due to its consistent tip shape
Sensitive nanoelectrical measurements with highly conductive coating
High resolution electrical imaging with a sharp conductive tip
High quality probe manufactured by Bruker AFM Probes
Low spring constant for contact resonance on softer materials such as polymers
Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications. Tip Geometry:
Rotated (Symmetric) Tip Height:
10 – 15 Front Angle:
15+/-2 Back Angle:
25+/-2 Side Angle:
17.5+/-2 Tip Radius (Nom):
100 Tip Radius (Max):
150 Tip Coating:
Conductive Diamond Tip Set Back (Nom):
9.5 Tip Set Back( RNG):
7 – 12 Cantilever Thickness (Nom):
2 Cantilever Thickness (RNG):
1.75-2.25 Cantilever Geometry:
Rectangular Cantilevers Number:
1 Front Side Coating:
Conductive Diamond Back Side Coating:
Reflective Aluminum
