Description
0.4N/m, 70kHz, Pt/Ir Tip Coating and Reflex Coating DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS PFTUNA probes combine the low spring constant and high sensitivity of a nitride cantilever with a sharp, electrically conductive tip. When used with Brukers exclusive PeakForce TUNA mode, they enable an unprecedented level of high resolution electrical characterization on fragile samples. Tip Geometry:
Rotated (Symmetric) Tip Height:
2.5 – 8 Front Angle:
15 ± 2.5 Back Angle:
25 ± 2.5 Side Angle:
17.5 ± 2.5 Tip Radius (Nom):
25 Tip Radius (Max):
35 Tip Coating:
Platinum/ Iridium Tip Set Back (Nom):
5 Tip Set Back( RNG):
3 – 7 PFTUNA probes have less than 3deg of cantilever bend. Cantilever Material:
Silicon Nitride Cantilever Thickness (Nom):
0.65 Cantilever Thickness (RNG):
0.6 – 0.7 Cantilever Geometry:
Triangular Cantilevers Number:
1 Front Side Coating:
Conductive Pt/ Ir Back Side Coating:
Reflective Pt/ Ir
